XIE, Xianghua. A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques. ELCVIA Electronic Letters on Computer Vision and Image Analysis, Cerdayola del Vallès, Spain, v. 7, n. 3, p. 1–22, 2008. DOI: 10.5565/rev/elcvia.268. Disponível em: https://elcvia.cvc.uab.cat/article/view/v7-n3-xie. Acesso em: 2 jun. 2025.